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The National Science Foundation (NSF) and the Semiconductor Research Corporation (SRC) are offering a collaborative research grant focusing on developing failure-resistant systems to address industry, academia, and societal needs. This grant aims to revolutionize the design of electronic circuits and systems to improve reliability in the face of transient, permanent, or systematic failures. By adopting a system-level cross-layer approach, researchers will explore innovative techniques to enhance system resilience, efficiency, and performance, ultimately impacting various industries and enhancing global competitiveness. Applications are welcome until July 26, 2012.
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Opportunity ID: 166694
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General Information
| Document Type:: | Grants Notice |
| Funding Opportunity Number:: | 12-556 |
| Funding Opportunity Title:: | FAILURE-RESISTANT SYSTEMS |
| Opportunity Category:: | Discretionary |
| Opportunity Category Explanation:: | |
| Funding Instrument Type:: | |
| Category of Funding Activity:: | Science and Technology and other Research and Development |
| Category Explanation:: | |
| Expected Number of Awards:: | 20 |
| Assistance Listings Number(s):: | 47.041 — Engineering Grants |
| Cost Sharing or Matching Requirement:: | No |
| Version:: | Synopsis 1 |
| Posted Date:: | Apr 24, 2012 |
| Last Updated Date:: | |
| Original Closing Date for Applications:: | Jul 26, 2012 |
| Current Closing Date for Applications:: | Jul 26, 2012 |
| Archive Date:: | Aug 26, 2012 |
| Estimated Total Program Funding:: | $ 6,000,000 |
| Award Ceiling:: | $400,000 |
| Award Floor:: | $300,000 |
Eligibility
| Eligible Applicants:: | Others (see text field entitled “Additional Information on Eligibility” for clarification) |
| Additional Information on Eligibility:: | *Organization Limit: Proposals may only be submitted by the following: -Universities and Colleges – Universities and two- and four-year colleges (including community colleges) accredited in, and having a campus located in the US, acting on behalf of their faculty members. Such organizations also are referred to as academic institutions. |
Additional Information
| Agency Name:: | National Science Foundation |
| Description:: | The National Science Foundation (NSF) and the Semiconductor Research Corporation (SRC) have agreed to embark on a new collaborative research program to address compelling research challenges in failure resistant systems that are of paramount importance to industry, academia, and society at large.New approaches in the design of electronic circuits and systems are needed for products and services that continue to operate correctly in the presence of transient, permanent, or systematic failures. From large information processing systems supporting communications and computation, to small embedded systems targeting medical and automotive applications, whole industries are facing the challenge of improving the reliability of systems. Increasing miniaturization and integrated circuit fabrication processes are creating a tension between reliability and efficiency. Higher rates of faults, variation, and degradation due to aging in integrated circuits are forcing systems engineers to assume that devices and circuits may not always perform as designed. More and more, systems are constructed using IP blocks (3rd party Intellectual Property) from different sources, contributing further to unpredictable behavior. ??Thus behavior under adverse conditions may not be fully known in deployed systems. Current techniques for ensuring reliability, such as voltage and clock rate margins, replication, and disk-based check-pointing will not be able to satisfy the competing requirements for future integrated circuits. These techniques typically operate only at one level of the system stack, yet layers from devices to applications all contribute to system reliability. Such single-layer techniques must be used under worst-case assumptions about the other layers in the stack.?? This potentially leads to inefficiencies that will make these techniques impractical in future fabrication processes. A system-level cross-layer approach to reliability, encompassing failure mechanisms of both digital and analog components, has the potential to deliver high reliability with significantly lower power and performance overheads than current single-layer techniques. By distributing reliability across the system design stack, cross-layer approaches can take advantage of the information available at each level, including even application-level knowledge, to efficiently tolerate errors, aging, and variation. This will allow handling of different physical effects at the most efficient stack layer, and can be adapted to varying application needs, operating environments, and changing hardware state. Fundamental new advances in techniques for designing and developing systems resilient to failure could have a significant impact on multiple industries and boost their competitiveness on a global scale, helping to transform market segments and translate research results into practice. |
| Link to Additional Information:: | |
| Grantor Contact Information:: | If you have difficulty accessing the full announcement electronically, please contact: |
Version History
| Version | Modification Description | Updated Date |
|---|---|---|
| Synopsis 1 |
Package Status
Below are CLOSED Opportunity Package(s) no longer available for this Funding Opportunity:
Package No: 1
| Assistance Listings: | 47.070 |
| Competition ID: | |
| Competition Title: | |
| Opportunity Package ID: | PKG00122893 |
| Opening Date: | Apr 24, 2012 |
| Closing Date: | Jul 26, 2012 |
| Agency Contact Information:: | Sankar Basu |
| Who Can Apply:: | Organization Applicants |
| mendatory_forms |
SF424 (R & R) [V1.2] Project/Performance Site Location(s) [V1.4] Research And Related Other Project Information [V1.3] Research And Related Senior/Key Person Profile (Expanded) [V1.2] Research & Related Personal Data [V1.2] Research & Related Budget [V1.1] NSF Cover Page [V1.3] |
| optional_forms |
R & R Subaward Budget Attachment(s) Form [V1.2] NSF Deviation Authorization [V1.1] NSF Suggested Reviewers [V1.1] NSF FastLane System Registration [V1.3] |
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Packages
| Assistance Listings | Competition ID | Competition Title | Opportunity Package ID | Opening Date | Closing Date | Actions | Who Can Apply: | |
|---|---|---|---|---|---|---|---|---|
| 47.070 | PKG00122893 | Apr 24, 2012 | Jul 26, 2012 | View | Sankar Basu | Organization Applicants |
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